Ｄｙ−１２３薄膜の作製と評価
Growth and evaluation of Dy-123
Energy Technology Research Institute, Tsukuba Central 2, AIST
°Mariappan Murugesan、小原春彦、山崎裕文
E-mail : m.murugesan*aist.go.jp
Keyword(s) : Thin film,Dy-123,surface resistance,,,
The performance of microwave passive devices fabricated from high temperature superconductor (HTS) materials directly depends on the surface resistance (Rs) of HTS thin films. Though the present Rs value of Y-123 thin films already appears minimum enough to meet the basic requirements for microwave devices, lower Rs can still have a dramatic effect on device performance. It has been widely reported that RE-123 films (RE = rare earths) have lower Rs values than the Y-123 films, and hence the RE-123 films may be a better candidate to fabricate passive device components. In particular, the microwave characteristics of Dy-123 appears to be superior than Y-123. In the present study, we have grown Dy-123 films on MgO substrates by laser ablation technique and the films were analyzed for their structural and microwave properties. A lower Rs value of Dy-123 films both at 20 K (37 mW at 10 GHz) as well as at 77 K (300 mW at 10 GHz) compared to Y-123 films (45 and 1300 mW at 10 GHz respectively at 20 K and 77 K) reveals that Dy-123 is a promising candidate for microwave applications. At the presentation, the results of microstructure and Rs obtained with Dy- 123 and Y-123 films will be discussed.