A NEW TYPE OF METHOD TO STUDY THE KINETIC INDUCTANCE OF HTSC FILMS BASED ON THE TUNNEL DIODE OSCILLATOR WITH AN OPEN-FLAT MEASURING COIL

E2-10

A NEW TYPE OF METHOD TO STUDY THE KINETIC INDUCTANCE OF HTSC FILMS BASED ON THE TUNNEL DIODE OSCILLATOR WITH AN OPEN-FLAT MEASURING COIL
Graduate School of ISEE, Kyushu University^A, Institute for Physical Research of NAS^B, Visiting Scientist from RRC Kurchatov Institute^C
@S.G. Gevorgyan^A,^B, T. Kiss^A, Y. Hanayama^A, A.A. Movsisyan^B, T. Matsushita^A, M. Takeo^A, V.S. Vysotsky^A,^C

　We developed a new type of the measuring method to study the kinetic inductance of HTSC thin films based on the tunnel diode oscillator with an open-flat coil. This method permits to improve the sensitivity of measurements up to 3-4 orders of value in comparison with the conventional methods. It may be used in different areas of cryogenic measurements. Particularly, we are using this method for magnetization measurements of YBCO thin films. We developed the test set-up based on this method to study the kinetic inductance of HTSC thin films. It permits us to detect with high sensitivity and resolution the changes of inductance of HTSC thin films originated from the small variation of the internal flux distribution. We present the basic principles of the measuring method and the preliminary results. Possible directions of the further improvement of the new method features are also suggested.